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  • Field Emission Scanning Electron Microscope (JOEL)


  • Thermal Analogue Computer (DSI)


  • Electron Probe(SHIMADZU)


  • 200KV Field Emission Transmission Electron Microscope (JOEL)


  • Supersonic Flaw Detector (KJTD)


  • Dual-beam Scanning Electron Microscope (FEI)